|
|
Donecker, J.; Rechenberg, I., Eds. ListingsIf you cannot find what you want on this page, then please use our search feature to search all our listings. Click on Title to view full description
|
|
|
|
1 |
Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) Held in Templin, Germany, 7-10 September 1997 [Institute of Physics Conference Series No. 160] Donecker, J.; Rechenberg, I., eds.
Institute of Physics Publishing, Bristol / Philadelphia. 1998. 0750305002 / 9780750305006
8vo, hardcover. No dj. Vg condition. Ex-lib copy w/ blacked-out stamping on endpapers & text-block edge; contents bright & clean, binding tight. xx, 524 p., illus.
Price:
15.00 USD
|
|
Add to Shopping Cart |
|
|
|
